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Compact Modeling and Design of Magneto-Electric Transistor Devices and Circuits

  • N. Sharma
  • , C. Binek
  • , A. Marshall
  • , J. P. Bird
  • , P. A. Dowben
  • , D. Nikonov
  • University of Texas at Dallas
  • University of Nebraska-Lincoln
  • Intel

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

14 Scopus citations

Abstract

A Verilog-A based model for the magneto-electric field effect transistor (MEFET) device is implemented and a variety of logic functions based on this device are proposed. These models are used to capture energy consumption and delay per switching event and to benchmark the MEFET with respect to CMOS. Single-source MEFET devices can be used for conventional logic gates like NAND, NOR, inverter and buffer and more complex circuits like the full adder. The dual source MEFET is an enhanced version of the MEFET device which functions like a spin multiplexer (spin-MUXer). Circuits using MEFETs require fewer components than CMOS to generate the same logic operation. These devices display a high on-off ratio., unlike many magneto-electric devices., and they operate at very low voltages., resulting in lower switching energy. Benchmarking results show that these devices perform better in terms of energy and delay., for implementing more complex functions., than the basic logic gates.

Original languageEnglish
Title of host publicationProceedings - 31st IEEE International System on Chip Conference, SOCC 2018
EditorsMircea Stan, Karan Bhatia, Helen Li, Massimo Alioto, Ramalingam Sridhar
PublisherIEEE Computer Society
Pages146-151
Number of pages6
ISBN (Electronic)9781538614907
DOIs
StatePublished - Jul 2 2018
Event31st IEEE International System on Chip Conference, SOCC 2018 - Arlington, United States
Duration: Sep 4 2018Sep 7 2018

Publication series

NameInternational System on Chip Conference
Volume2018-September
ISSN (Print)2164-1676
ISSN (Electronic)2164-1706

Conference

Conference31st IEEE International System on Chip Conference, SOCC 2018
Country/TerritoryUnited States
CityArlington
Period09/4/1809/7/18

Keywords

  • 2D
  • benchmarking
  • chromia
  • CMOS
  • Magneto-electric
  • ME-MTJ
  • MEFET
  • narrow channel
  • proximity effect

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