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CMOS direct time interval measurement of long-lived luminescence lifetimes

  • Lei Yao
  • , Ka Yi Yung
  • , Maurice C. Cheung
  • , Vamsy P. Chodavarapu
  • , Frank V. Bright
  • McGill University
  • SUNY Buffalo

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

We describe a Complementary Metal-Oxide Semiconductor (CMOS) Direct Time Interval Measurement (DTIM) Integrated Circuit (IC) to detect the decay (fall) time of the luminescence emission when analyte-sensitive luminophores are excited with an optical pulse. The CMOS DTIM IC includes 1414 phototransistor array, transimpedance amplifier, regulated gain amplifier, fall time detector, and time-to-digital convertor. We examined the DTIM system to measure the emission lifetime of oxygen-sensitive luminophores tris(4,7-diphenyl-1, 10-phenanthroline) ruthenium(II) ([Ru(dpp)3]2) encapsulated in sol-gel derived xerogel thin-films. The DTIM system fabricated using TSMC 0.35m process functions to detect lifetimes from 4s to 14.4s but can be tuned to detect longer lifetimes. The system provides 8-bit digital output proportional to lifetimes and consumes 4.5mW of power with 3.3V DC supply. The CMOS system provides a useful platform for the development of reliable, robust, and miniaturized optical chemical sensors.

Original languageEnglish
Title of host publication33rd Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS 2011
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages5-9
Number of pages5
ISBN (Print)9781424441211
DOIs
StatePublished - 2011
Event33rd Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS 2011 - Boston, MA, United States
Duration: Aug 30 2011Sep 3 2011

Publication series

NameProceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS
ISSN (Print)1557-170X

Conference

Conference33rd Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS 2011
Country/TerritoryUnited States
CityBoston, MA
Period08/30/1109/3/11

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