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Charge-fluctuation-induced dephasing of exchange-coupled spin qubits

  • University of Maryland, College Park

Research output: Contribution to journalArticlepeer-review

178 Scopus citations

Abstract

Exchange-coupled spin qubits in semiconductor nanostructures are shown to be vulnerable to dephasing caused by charge noise invariably present in the semiconductor environment. This decoherence of exchange gate by environmental charge fluctuations arises from the fundamental Coulombic nature of the Heisenberg coupling and presents a serious challenge to the scalability of the widely studied exchange gate solid state spin quantum computer architectures. We estimate dephasing times for coupled spin qubits in a wide range (from 1 ns up to >1μs) depending on the exchange coupling strength and its sensitivity to charge fluctuations.

Original languageEnglish
Article number100501
JournalPhysical Review Letters
Volume96
Issue number10
DOIs
StatePublished - 2006

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