Skip to main navigation Skip to search Skip to main content

Characterization of tantalum oxide-ruthenium oxide hybrid capacitors

  • Tzu Yen Chang
  • , Xu Wang
  • , David A. Evans
  • , S. L. Roberson
  • , Jim P. Zheng
  • Florida State University
  • AU Optronics Taiwan
  • Evans Capacitor Company
  • Air Force Research Laboratory

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

The ac and dc performance and leakage current of Evans tantalum oxide-ruthenium oxide hybrid capacitors were characterized at room temperature. The RC time constants were in the range from 2 to 0.45 ms and dependent on the maximum operational voltage of the capacitor. The gravimetric and volumetric energy densities of hybrid capacitors were in the range of 0.074-0.233 J/g and 0.388-1.384 J/cm3, respectively. The gravimetric and volumetric power densities of hybrid capacitors were in the range of 19-259 W/g and 100-1540 W/cm 3, respectively. A comparison of the performance between hybrid capacitors to conventional aluminum and tantalum electrolytic capacitors is made in this paper.

Original languageEnglish
Pages (from-to)1313-1317
Number of pages5
JournalIEEE Transactions on Industrial Electronics
Volume51
Issue number6
DOIs
StatePublished - Dec 2004

Keywords

  • AC impedance
  • Hybrid capacitors
  • Ruthenium oxide
  • Tantalum oxide

Fingerprint

Dive into the research topics of 'Characterization of tantalum oxide-ruthenium oxide hybrid capacitors'. Together they form a unique fingerprint.

Cite this