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Characterization of nanomagnet fringing fields in hybrid semiconductor/ferromagnetic devices

  • J. U. Bae
  • , T. Y. Lin
  • , Y. Yoon
  • , S. J. Kim
  • , J. P. Bird
  • , A. Imre
  • , W. Porod
  • , J. L. Reno
  • SUNY Buffalo
  • University of Notre Dame
  • Sandia National Laboratories, New Mexico

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

We describe the fabrication of a hybrid nanomagneto-electronic device, consisting of a GaAs/AlGaAs quantum wire that is bridged by a ferromagnetic gate, and study the influence of the nanomagnet fringing fields on the quantum-wire magneto-resistance. The nonplanar gate shows clear single-domain structure in magnetic-force microscopy, and a simple magnetization behavior in an external magnetic field. This behavior is reflected as a hysteretic variation of the quantum-wire magneto-resistance, whose magnitude is found to be consistent with theoretical predictions for ballistic electron transport through a spatially varying magnetic field.

Original languageEnglish
Pages (from-to)4706-4710
Number of pages5
JournalIEEE Transactions on Magnetics
Volume44
Issue number12
DOIs
StatePublished - Dec 2008

Keywords

  • Ferromagnet
  • Hysteresis
  • Magneto-electronics
  • Magneto-resistance

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