Abstract
Carrier multiplication (CM) is the process of generating multiple electron-hole pairs from one absorbed photon. Narrow-gap InN is a material that has been proposed for achieving efficient CM. We quantify the CM efficiency in bulk InN using terahertz time-domain spectroscopy. While the CM onset occurs at relatively low photon energies in InN (1.7 ± 0.2 eV), corresponding to 2.7 ± 0.3 times its bandgap, the excitation efficiency above the onset increases linearly with a slope of only ∼13/Eg. Based on these numbers, the efficiency increase of an InN based photovoltaic device owing to CM is limited to maximum 1 point.
| Original language | English |
|---|---|
| Article number | 222113 |
| Journal | Applied Physics Letters |
| Volume | 101 |
| Issue number | 22 |
| DOIs | |
| State | Published - Nov 26 2012 |
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