Capacitors - past, present, and future: A transnational perspective

W. J. Sarjeant; R. E. Dollinger; J. Zirnheld; F. W. MacDougall; H. Goldberg

Capacitors - past, present, and future: A transnational perspective

W. J. Sarjeant
, R. E. Dollinger
, J. Zirnheld
, F. W. MacDougall
, H. Goldberg

Department of Electrical Engineering

SUNY Buffalo

Research output: Contribution to journal › Conference article › peer-review

3 Scopus citations

Abstract

Over the last decade, significant increases in capacitor reliability have been achieved through a combination of advanced manufacturing techniques, new materials, and diagnostic methodologies to provide requisite life-cycle reliability for high energy pulse applications. Recent innovations in analysis of aging, including dimensional analysis, are introduced for predicting component performance and fault tolerance.

Original language	English
Pages (from-to)	209-212
Number of pages	4
Journal	IEEE Conference Record of Power Modulator Symposium
State	Published - 1996
Event	Proceedings of the 1996 22nd International Power Modulator Symposium - Boca Raton, FL, USA Duration: Jun 24 1996 → Jun 27 1996

Cite this

@article{62e40429897e4c7d9d09043d160861a6,

title = "Capacitors - past, present, and future: A transnational perspective",

abstract = "Over the last decade, significant increases in capacitor reliability have been achieved through a combination of advanced manufacturing techniques, new materials, and diagnostic methodologies to provide requisite life-cycle reliability for high energy pulse applications. Recent innovations in analysis of aging, including dimensional analysis, are introduced for predicting component performance and fault tolerance.",

author = "Sarjeant, \{W. J.\} and Dollinger, \{R. E.\} and J. Zirnheld and MacDougall, \{F. W.\} and H. Goldberg",

year = "1996",

language = "English",

pages = "209--212",

journal = "IEEE Conference Record of Power Modulator Symposium",

issn = "1076-8467",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "Proceedings of the 1996 22nd International Power Modulator Symposium ; Conference date: 24-06-1996 Through 27-06-1996",

}

TY - JOUR

T1 - Capacitors - past, present, and future

T2 - Proceedings of the 1996 22nd International Power Modulator Symposium

AU - Sarjeant, W. J.

AU - Dollinger, R. E.

AU - Zirnheld, J.

AU - MacDougall, F. W.

AU - Goldberg, H.

PY - 1996

Y1 - 1996

N2 - Over the last decade, significant increases in capacitor reliability have been achieved through a combination of advanced manufacturing techniques, new materials, and diagnostic methodologies to provide requisite life-cycle reliability for high energy pulse applications. Recent innovations in analysis of aging, including dimensional analysis, are introduced for predicting component performance and fault tolerance.

AB - Over the last decade, significant increases in capacitor reliability have been achieved through a combination of advanced manufacturing techniques, new materials, and diagnostic methodologies to provide requisite life-cycle reliability for high energy pulse applications. Recent innovations in analysis of aging, including dimensional analysis, are introduced for predicting component performance and fault tolerance.

UR - https://www.scopus.com/pages/publications/0030409108

M3 - Conference article

AN - SCOPUS:0030409108

SN - 1076-8467

SP - 209

EP - 212

JO - IEEE Conference Record of Power Modulator Symposium

JF - IEEE Conference Record of Power Modulator Symposium

Y2 - 24 June 1996 through 27 June 1996

ER -

Capacitors - past, present, and future: A transnational perspective

Abstract

Other files and links

Fingerprint

Cite this