TY - GEN
T1 - Buffer insertion considering process variation
AU - Xiong, Jinjun
AU - Tarn, Kingho
AU - He, Lei
PY - 2005
Y1 - 2005
N2 - A comprehensive probabilistic methodology is proposed to solve the buffer insertion problem with the consideration of process variations. In contrast to a recent work, we point out. for the first time, that the correlation between the required arrival time and the downstream loading capacitance must be considered in order to solve the problem "correctly". We develop an efficient bottom-up recursive algorithm to calculate the joint probability density function that accurately captures the above correlation, and propose effective pruning rules to exclude probabilistically inferior solutions. We verify our buffer insertion using timing analysis with both device and interconnect variations, and show that compared to the conventional buffer insertion algorithm using nominal device and interconnect parameters, our new buffer insertion methodology can reduce the probability of timing violation by up to 30%.
AB - A comprehensive probabilistic methodology is proposed to solve the buffer insertion problem with the consideration of process variations. In contrast to a recent work, we point out. for the first time, that the correlation between the required arrival time and the downstream loading capacitance must be considered in order to solve the problem "correctly". We develop an efficient bottom-up recursive algorithm to calculate the joint probability density function that accurately captures the above correlation, and propose effective pruning rules to exclude probabilistically inferior solutions. We verify our buffer insertion using timing analysis with both device and interconnect variations, and show that compared to the conventional buffer insertion algorithm using nominal device and interconnect parameters, our new buffer insertion methodology can reduce the probability of timing violation by up to 30%.
UR - https://www.scopus.com/pages/publications/33646931776
U2 - 10.1109/DATE.2005.85
DO - 10.1109/DATE.2005.85
M3 - Conference contribution
AN - SCOPUS:33646931776
SN - 0769522882
SN - 9780769522883
T3 - Proceedings -Design, Automation and Test in Europe, DATE '05
SP - 970
EP - 975
BT - Proceedings - Design, Automation and Test in Europe, DATE '05
T2 - Design, Automation and Test in Europe, DATE '05
Y2 - 7 March 2005 through 11 March 2005
ER -