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Benchmarking Spurious Bias in Few-Shot Image Classifiers

  • University of Virginia

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

10 Scopus citations

Abstract

Few-shot image classifiers are designed to recognize and classify new data with minimal supervision and limited data but often show reliance on spurious correlations between classes and spurious attributes, known as spurious bias. Spurious correlations commonly hold in certain samples and few-shot classifiers can suffer from spurious bias induced from them. There is an absence of an automatic benchmarking system to assess the robustness of few-shot classifiers against spurious bias. In this paper, we propose a systematic and rigorous benchmark framework, termed Few-STAB, to fairly demonstrate and quantify varied degrees of robustness of few-shot classifiers to spurious bias. FewSTAB creates few-shot evaluation tasks with biased attributes so that using them for predictions can demonstrate poor performance. To construct these tasks, we propose attribute-based sample selection strategies based on a pre-trained vision-language model, eliminating the need for manual dataset curation. This allows Few-STAB to automatically benchmark spurious bias using any existing test data. FewSTAB offers evaluation results in a new dimension along with a new design guideline for building robust classifiers. Moreover, it can benchmark spurious bias in varied degrees and enable designs for varied degrees of robustness. Its effectiveness is demonstrated through experiments on ten few-shot learning methods across three datasets. We hope our framework can inspire new designs of robust few-shot classifiers. Our code is available at https://github.com/gtzheng/FewSTAB.

Original languageEnglish
Title of host publicationComputer Vision – ECCV 2024 - 18th European Conference, Proceedings
EditorsAleš Leonardis, Elisa Ricci, Stefan Roth, Olga Russakovsky, Torsten Sattler, Gül Varol
PublisherSpringer Science and Business Media Deutschland GmbH
Pages346-364
Number of pages19
ISBN (Print)9783031729881
DOIs
StatePublished - 2025
Event18th European Conference on Computer Vision, ECCV 2024 - Milan, Italy
Duration: Sep 29 2024Oct 4 2024

Publication series

NameLecture Notes in Computer Science
Volume15138 LNCS
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349

Conference

Conference18th European Conference on Computer Vision, ECCV 2024
Country/TerritoryItaly
CityMilan
Period09/29/2410/4/24

Keywords

  • Benchmark system
  • Few-shot classification
  • Robustness
  • Spurious bias

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