@inproceedings{f4e88e1eeed24739801c1db1df48f740,
title = "Benchmarking Image Classifiers for Physical Out-of-Distribution Examples Detection",
abstract = "The rising popularity of deep neural networks (DNNs) in computer vision has raised concerns about their robustness in the real world. Recent works in this field have well-demonstrated the vulnerability of these networks to carefully crafted adversarial attacks which yield out-of-distribution (OOD) samples. Interestingly, the majority of the existing literature focuses on adversarial attacks crafted for the digital domain only. Physical adversarial attacks are easier to deploy in the real world and yield higher attack success than digital perturbations. The prime limitation of such a dearth of studies handling physical out-of-distribution images is the lack of benchmark datasets. To overcome this limitation, this research proposes a novel out-of-distribution dataset using adversarial patches of different variations to advance the robustness of deep networks against such stealthy out-of-distribution images. We have also conducted extensive experiments both under seen and unseen patch settings and observed that unseen adversarial patches are hard to defend. By conducting this study and delving into the complexities of defending against patch attacks, we believe it will serve as inspiration for future researchers to incorporate physical OOD attacks into their defense strategies.",
keywords = "Adversarial Defense, Adversarial Patches, Out of distribution Examples",
author = "Ojaswee and Akshay Agarwal and Nalini Ratha",
note = "Publisher Copyright: {\textcopyright} 2023 IEEE.; 19th IEEE/CVF International Conference on Computer Vision Workshops, ICCVW 2023 ; Conference date: 02-10-2023 Through 06-10-2023",
year = "2023",
doi = "10.1109/ICCVW60793.2023.00477",
language = "English",
series = "Proceedings - 2023 IEEE/CVF International Conference on Computer Vision Workshops, ICCVW 2023",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "4429--4437",
booktitle = "Proceedings - 2023 IEEE/CVF International Conference on Computer Vision Workshops, ICCVW 2023",
address = "United States",
}