TY - GEN
T1 - Background Line Detection with A Stochastic Model
AU - Zheng, Yefeng
AU - Li, Huiping
AU - Doermann, David
N1 - Publisher Copyright:
© 2003 IEEE.
PY - 2003
Y1 - 2003
N2 - Background lines often exist in textual documents. It is important to detect and remove those lines so text can be easily segmented and recognized. A stochastic model is proposed in this paper which incorporates the high level contextual information to detect severely broken lines. We observed that 1) background lines are parallel, and 2) the vertical gaps between any two neighboring lines are roughly equal with small variance. The novelty of our algorithm is we use a HMM model to model the projection profile along the estimated skew angle, and estimate the optimal positions of all background lines simultaneously based on the Viterbi algorithm. Compared with our previous deterministic model based approach [15], the new method is much more robust and detects about 96.8% background lines correctly in our Arabic document database.
AB - Background lines often exist in textual documents. It is important to detect and remove those lines so text can be easily segmented and recognized. A stochastic model is proposed in this paper which incorporates the high level contextual information to detect severely broken lines. We observed that 1) background lines are parallel, and 2) the vertical gaps between any two neighboring lines are roughly equal with small variance. The novelty of our algorithm is we use a HMM model to model the projection profile along the estimated skew angle, and estimate the optimal positions of all background lines simultaneously based on the Viterbi algorithm. Compared with our previous deterministic model based approach [15], the new method is much more robust and detects about 96.8% background lines correctly in our Arabic document database.
UR - https://www.scopus.com/pages/publications/75649143828
U2 - 10.1109/CVPRW.2003.10029
DO - 10.1109/CVPRW.2003.10029
M3 - Conference contribution
AN - SCOPUS:75649143828
T3 - IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
SP - 23
EP - 30
BT - 2003 Conference on Computer Vision and Pattern Recognition Workshop, CVPRW 2003
PB - IEEE Computer Society
T2 - Conference on Computer Vision and Pattern Recognition Workshop, CVPRW 2003
Y2 - 16 June 2003 through 22 June 2003
ER -