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Atomic-scale tomography: A 2020 vision

  • Thomas F. Kelly
  • , Michael K. Miller
  • , Krishna Rajan
  • , Simon P. Ringer
  • CAMECA
  • Oak Ridge National Laboratory
  • The University of Sydney

Research output: Contribution to journalReview articlepeer-review

47 Scopus citations

Abstract

Atomic-scale tomography (AST) is defined and its place in microscopy is considered. Arguments are made that AST, as defined, would be the ultimate microscopy. The available pathways for achieving AST are examined and we conclude that atom probe tomography (APT) may be a viable basis for AST on its own and that APT in conjunction with transmission electron microscopy is a likely path as well. Some possible configurations of instrumentation for achieving AST are described. The concept of metaimages is introduced where data from multiple techniques are melded to create synergies in a multidimensional data structure. When coupled with integrated computational materials engineering, structure-properties microscopy is envisioned. The implications of AST for science and technology are explored.

Original languageEnglish
Pages (from-to)652-664
Number of pages13
JournalMicroscopy and Microanalysis
Volume19
Issue number3
DOIs
StatePublished - Apr 2013

Keywords

  • 2020 Vision
  • atom probe microscopy
  • atom probe tomography
  • atomic-scale tomography
  • integrated computational materials engineering

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