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Anomalies in the resistivity of thin Bi films

  • Stony Brook University
  • Brookhaven National Laboratory

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

For film thickness less than 400 Å, the value of the electron wavelength in Bi, hysteresis and other anomalies in the resistivity versus temperature curves are observed.

Original languageEnglish
Pages (from-to)631-632
Number of pages2
JournalPhysics Letters A
Volume29
Issue number10
DOIs
StatePublished - Aug 11 1969

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