Annihilation mechanisms in thin film grain growth

M. A. Palmer; M. E. Glicksman; K. Rajan

doi:10.1016/S1359-6462(02)00582-1

Annihilation mechanisms in thin film grain growth

M. A. Palmer
, M. E. Glicksman
, K. Rajan

Department of Materials Design and Innovation

Kettering University

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

Grain growth in succinonitrile thin films is dominated by topological effects [Scripta Metall. Mater. 30 (1994) 633; Metall. Mater. Trans. A 26 (1995) 1061; Philos. Mag. 79(4) (1999) 763]. The topological transformations are effected by the shortened length of the grain boundaries [R.T. De Hoff, in: H. Weiland, B.L. Adams, A.D. Rollet, Grain Growth in Polycrystalline Materials III, TMS, 1998, p. 225; Acta Mater. 48 (1998) 5175]. To explain how these events occur in three dimensions each face of a grain is assumed to behave as predicted by Smith [Metal Interf. 3 (1952) 65; Contemporary Phys. 25 (1984) 59], and placed in the context of work by Fortes and Ferro [Acta Metall. 33 (1985) 1697; 1683].

Original language	English
Pages (from-to)	1173-1178
Number of pages	6
Journal	Scripta Materialia
Volume	48
Issue number	8
DOIs	https://doi.org/10.1016/S1359-6462(02)00582-1
State	Published - Apr 14 2003

Keywords

Grain growth

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10.1016/S1359-6462(02)00582-1

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title = "Annihilation mechanisms in thin film grain growth",

abstract = "Grain growth in succinonitrile thin films is dominated by topological effects [Scripta Metall. Mater. 30 (1994) 633; Metall. Mater. Trans. A 26 (1995) 1061; Philos. Mag. 79(4) (1999) 763]. The topological transformations are effected by the shortened length of the grain boundaries [R.T. De Hoff, in: H. Weiland, B.L. Adams, A.D. Rollet, Grain Growth in Polycrystalline Materials III, TMS, 1998, p. 225; Acta Mater. 48 (1998) 5175]. To explain how these events occur in three dimensions each face of a grain is assumed to behave as predicted by Smith [Metal Interf. 3 (1952) 65; Contemporary Phys. 25 (1984) 59], and placed in the context of work by Fortes and Ferro [Acta Metall. 33 (1985) 1697; 1683].",

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T1 - Annihilation mechanisms in thin film grain growth

AU - Palmer, M. A.

AU - Glicksman, M. E.

AU - Rajan, K.

PY - 2003/4/14

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N2 - Grain growth in succinonitrile thin films is dominated by topological effects [Scripta Metall. Mater. 30 (1994) 633; Metall. Mater. Trans. A 26 (1995) 1061; Philos. Mag. 79(4) (1999) 763]. The topological transformations are effected by the shortened length of the grain boundaries [R.T. De Hoff, in: H. Weiland, B.L. Adams, A.D. Rollet, Grain Growth in Polycrystalline Materials III, TMS, 1998, p. 225; Acta Mater. 48 (1998) 5175]. To explain how these events occur in three dimensions each face of a grain is assumed to behave as predicted by Smith [Metal Interf. 3 (1952) 65; Contemporary Phys. 25 (1984) 59], and placed in the context of work by Fortes and Ferro [Acta Metall. 33 (1985) 1697; 1683].

AB - Grain growth in succinonitrile thin films is dominated by topological effects [Scripta Metall. Mater. 30 (1994) 633; Metall. Mater. Trans. A 26 (1995) 1061; Philos. Mag. 79(4) (1999) 763]. The topological transformations are effected by the shortened length of the grain boundaries [R.T. De Hoff, in: H. Weiland, B.L. Adams, A.D. Rollet, Grain Growth in Polycrystalline Materials III, TMS, 1998, p. 225; Acta Mater. 48 (1998) 5175]. To explain how these events occur in three dimensions each face of a grain is assumed to behave as predicted by Smith [Metal Interf. 3 (1952) 65; Contemporary Phys. 25 (1984) 59], and placed in the context of work by Fortes and Ferro [Acta Metall. 33 (1985) 1697; 1683].

KW - Grain growth

UR - https://www.scopus.com/pages/publications/0037437279

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DO - 10.1016/S1359-6462(02)00582-1

M3 - Article

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SN - 1359-6462

VL - 48

SP - 1173

EP - 1178

JO - Scripta Materialia

JF - Scripta Materialia

IS - 8

ER -

Annihilation mechanisms in thin film grain growth

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