Abstract
The angular-dependent critical current density in YBa 2Cu 3O 7 films deposited on MgO templates was investigated. The films were grown by ion-beam-assisted deposition. Three angular regimes in which pinning is dominated by different types of defects were also reported. Results show that over large fields and angular ranges, the critical current density is higher on coated conductors.
| Original language | English |
|---|---|
| Pages (from-to) | 2121-2123 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 84 |
| Issue number | 12 |
| DOIs | |
| State | Published - Mar 22 2004 |
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