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Amorphous and micro-crystalline silicon for photovoltaic application

  • SUNY Buffalo

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We have investigated the influence of anneal treatment on hydrogenated amorphous silicon films. The a-Si:H was deposited on metal substrates. Structures investigated were i/n+/Mo, n/ n+/Mo, p/p+/Mo, and PIN/N+/S.S. Dark and light I-V studies show an improvement in short circuit current and open circuit voltage with a low temperature anneal (200-300°C). Raman scattering spectroscopy examination showed that a microcrystallization initiated even at a low temperature of 600°C. We find that anneal time has only a small effect on crystallization but that the anneal temperature has a critical effect. The microcrystalline silicon exhibited improved photo response after r.f. plasma hydrogen passivation of grain boundaries.

Original languageEnglish
Title of host publicationConference Record of the IEEE Photovoltaic Specialists Conference
Editors Anon
PublisherPubl by IEEE
Pages977-980
Number of pages4
ISBN (Print)0780312201
StatePublished - 1993
EventProceedings of the 23rd IEEE Photovoltaic Specialists Conference - Louisville, KY, USA
Duration: May 10 1993May 14 1993

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371

Conference

ConferenceProceedings of the 23rd IEEE Photovoltaic Specialists Conference
CityLouisville, KY, USA
Period05/10/9305/14/93

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