TY - GEN
T1 - A series DC arc fault detection method and hardware implementation
AU - Yao, Xiu
AU - Herrera, Luis
AU - Wang, Jin
PY - 2013
Y1 - 2013
N2 - DC arc fault detection is important to provide circuit protection and improve system reliability in applications with high voltage dc bus. In this paper, current change in time domain and normalized RMS value from wavelet decomposition are selected as arc signatures representing the randomness and chaotic nature of arcing. A detection algorithm is then proposed utilizing these two arc signatures to differentiate between arc fault and normal condition. Lastly the detection algorithm is realized on a digital signal processing board and is tested to verify its effectiveness. Experiment results show that the proposed detection algorithm can detect arc fault in a timely manner and is free of nuisance trip from normal circuit operations such as load change condition.
AB - DC arc fault detection is important to provide circuit protection and improve system reliability in applications with high voltage dc bus. In this paper, current change in time domain and normalized RMS value from wavelet decomposition are selected as arc signatures representing the randomness and chaotic nature of arcing. A detection algorithm is then proposed utilizing these two arc signatures to differentiate between arc fault and normal condition. Lastly the detection algorithm is realized on a digital signal processing board and is tested to verify its effectiveness. Experiment results show that the proposed detection algorithm can detect arc fault in a timely manner and is free of nuisance trip from normal circuit operations such as load change condition.
UR - https://www.scopus.com/pages/publications/84879394297
U2 - 10.1109/APEC.2013.6520638
DO - 10.1109/APEC.2013.6520638
M3 - Conference contribution
AN - SCOPUS:84879394297
SN - 9781467343541
T3 - Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
SP - 2444
EP - 2449
BT - 2013 28th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2013
T2 - 28th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2013
Y2 - 17 March 2013 through 21 March 2013
ER -