A Revised Process To Increase Efficiency and Reproducibility In Cr-MIS Solar Cells

W. A. Anderson; G. Rajeswaran; K. Rajkanan; G. Hoeft

doi:10.1109/EDL.1980.25258

A Revised Process To Increase Efficiency and Reproducibility In Cr-MIS Solar Cells

W. A. Anderson
, G. Rajeswaran
, K. Rajkanan
, G. Hoeft

Department of Electrical Engineering

SUNY Buffalo

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

A new process has been introduced to improve both efficiency and reproducibility of Cr-MIS solar cells. Active area efficiencies of up to 13.2% have been measured for 2 cm2 cells. These improvements are due to increased silicon surface cleanliness, an optimized interfacial oxide thickness, and a one pump-down vacuum process. Spectral response data correspond to measured Jsc: values and predict a reduced diffusion length of 64 μm in Wacker poly-Si caused by grain boundary effects.

Original language	English
Pages (from-to)	128-130
Number of pages	3
Journal	IEEE Electron Device Letters
Volume	1
Issue number	7
DOIs	https://doi.org/10.1109/EDL.1980.25258
State	Published - Jul 1980

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10.1109/EDL.1980.25258

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abstract = "A new process has been introduced to improve both efficiency and reproducibility of Cr-MIS solar cells. Active area efficiencies of up to 13.2\% have been measured for 2 cm2 cells. These improvements are due to increased silicon surface cleanliness, an optimized interfacial oxide thickness, and a one pump-down vacuum process. Spectral response data correspond to measured Jsc: values and predict a reduced diffusion length of 64 μm in Wacker poly-Si caused by grain boundary effects.",

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AU - Hoeft, G.

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AB - A new process has been introduced to improve both efficiency and reproducibility of Cr-MIS solar cells. Active area efficiencies of up to 13.2% have been measured for 2 cm2 cells. These improvements are due to increased silicon surface cleanliness, an optimized interfacial oxide thickness, and a one pump-down vacuum process. Spectral response data correspond to measured Jsc: values and predict a reduced diffusion length of 64 μm in Wacker poly-Si caused by grain boundary effects.

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A Revised Process To Increase Efficiency and Reproducibility In Cr-MIS Solar Cells

Abstract

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