Abstract
We present a novel test scheduling algorithm for embedded core-based SoCs. We formulate the test scheduling as a shortest path problem with the feature of evenly balanced resource usage. Improvements to the basic algorithm are sought by core-grouping and all-permutation scheduling. We also extend the algorithm to allow multiple test sets selection to facilitate the testing for various fault models. A simulation study is performed to quantify the benefits of our new scheduling approach.
| Original language | English |
|---|---|
| Pages (from-to) | V525-V528 |
| Journal | Proceedings - IEEE International Symposium on Circuits and Systems |
| Volume | 5 |
| State | Published - 2003 |
| Event | Proceedings of the 2003 IEEE International Symposium on Circuits and Systems - Bangkok, Thailand Duration: May 25 2003 → May 28 2003 |
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