@inproceedings{4ab044227ab241eda264fbcd672c7962,
title = "A lifetime and power sensitive design optimization framework for a radio frequency circuit",
abstract = "This paper presents a lifetime and power sensitive framework for optimizing a radio frequency circuit. A lifetime assessment flow for a radio frequency circuit is proposed for frontend-of-line (FEOL) time-dependent dielectric breakdown (TDDB). Also, a model relating a transistor's width and performance metrics along with circuit lifetime is constructed via multivariate adaptive regression splines (MARS). The resulting lifetime, power and design specifications trade-off information can be used to guide a circuit designer to improve their circuits in a more robust and reliable way.",
keywords = "design optimization, frontend-of-line dielectric breakdown, lifetime assessment, power, radio frequency circuit, reliability, time-dependent dielectric breakdown, wearout",
author = "Kexin Yang and Taizhi Liu and Rui Zhang and Linda Milor",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 2017 IEEE International Integrated Reliability Workshop, IIRW 2017 ; Conference date: 08-10-2017 Through 12-10-2017",
year = "2017",
month = jul,
day = "2",
doi = "10.1109/IIRW.2017.8361242",
language = "English",
series = "IEEE International Integrated Reliability Workshop Final Report",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1--4",
booktitle = "2017 IEEE International Integrated Reliability Workshop, IIRW 2017",
address = "United States",
}