Abstract
Pattern-based clustering has broad applications in microarray data analysis, customer segmentation, e-business data analysis, etc. However, pattern-based clustering often returns a large number of highly-overlapping clusters, which makes it hard for users to identify interesting patterns from the mining results. Moreover, there lacks of a general model for pattern-based clustering. Different kinds of patterns or different measures on the pattern coherence may require different algorithms. In this paper, we address the above two problems by proposing a general quality-driven approach to mining top-k quality pattern-based clusters. We examine our quality-driven approach using real world microarray data sets. The experimental results show that our method is general, effective and efficient.
| Original language | English |
|---|---|
| Pages (from-to) | 188-200 |
| Number of pages | 13 |
| Journal | Lecture Notes in Computer Science |
| Volume | 3453 |
| DOIs | |
| State | Published - 2005 |
| Event | 10th International Conference on Database Systems for Advanced Applications, DASFAA 2005 - Beijing, China Duration: Apr 17 2005 → Apr 20 2005 |
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