A comparison of buffer layer architectures on continuously processed YBCO coated conductors based on the IBAD YSZ process

T. G. Holesinger; S. R. Foltyn; P. N. Arendt; Q. Jia; P. C. Dowden; R. F. DePaula; J. R. Groves

doi:10.1109/77.919783

A comparison of buffer layer architectures on continuously processed YBCO coated conductors based on the IBAD YSZ process

T. G. Holesinger
, S. R. Foltyn
, P. N. Arendt
, Q. Jia
, P. C. Dowden
, R. F. DePaula
, J. R. Groves

Department of Materials Design and Innovation

Los Alamos National Laboratory

Research output: Contribution to journal › Conference article › peer-review

41 Scopus citations

Abstract

The microstructures of continuously processed YBa₂Cu₃O_y (YBCO) coated conductors processed with three different architectures are presented. YBCO films were deposited directly on ion-beam-assisted deposition (IBAD) yttria-stabilized zirconia (YSZ) or on intervening layers of Y₂O₃ or CeO₂. Different interfacial reactions were observed in each case. The volume changes that occur with the interfacial reactions were calculated based on the identified reaction products. The calculated volume changes correlate with the observed micostructures and appear to be an important factor in determining an optimal buffer layer system. The interfacial reactions do not preclude the attainment of high I_c and J_c values in these coated conductors.

Original language	English
Pages (from-to)	3359-3364
Number of pages	6
Journal	IEEE Transactions on Applied Superconductivity
Volume	11
Issue number	1 III
DOIs	https://doi.org/10.1109/77.919783
State	Published - Mar 2001
Event	2000 Applied Superconductivity Conference - Virginia Beach, VA, United States Duration: Sep 17 2000 → Sep 22 2000

Keywords

Coated conductor
IBAD
TEM
YBCO

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10.1109/77.919783

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title = "A comparison of buffer layer architectures on continuously processed YBCO coated conductors based on the IBAD YSZ process",

abstract = "The microstructures of continuously processed YBa2Cu3Oy (YBCO) coated conductors processed with three different architectures are presented. YBCO films were deposited directly on ion-beam-assisted deposition (IBAD) yttria-stabilized zirconia (YSZ) or on intervening layers of Y2O3 or CeO2. Different interfacial reactions were observed in each case. The volume changes that occur with the interfacial reactions were calculated based on the identified reaction products. The calculated volume changes correlate with the observed micostructures and appear to be an important factor in determining an optimal buffer layer system. The interfacial reactions do not preclude the attainment of high Ic and Jc values in these coated conductors.",

keywords = "Coated conductor, IBAD, TEM, YBCO",

author = "Holesinger, \{T. G.\} and Foltyn, \{S. R.\} and Arendt, \{P. N.\} and Q. Jia and Dowden, \{P. C.\} and DePaula, \{R. F.\} and Groves, \{J. R.\}",

year = "2001",

month = mar,

doi = "10.1109/77.919783",

language = "English",

volume = "11",

pages = "3359--3364",

journal = "IEEE Transactions on Applied Superconductivity",

issn = "1051-8223",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "1 III",

note = "2000 Applied Superconductivity Conference ; Conference date: 17-09-2000 Through 22-09-2000",

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TY - JOUR

T1 - A comparison of buffer layer architectures on continuously processed YBCO coated conductors based on the IBAD YSZ process

AU - Holesinger, T. G.

AU - Foltyn, S. R.

AU - Arendt, P. N.

AU - Jia, Q.

AU - Dowden, P. C.

AU - DePaula, R. F.

AU - Groves, J. R.

PY - 2001/3

Y1 - 2001/3

N2 - The microstructures of continuously processed YBa2Cu3Oy (YBCO) coated conductors processed with three different architectures are presented. YBCO films were deposited directly on ion-beam-assisted deposition (IBAD) yttria-stabilized zirconia (YSZ) or on intervening layers of Y2O3 or CeO2. Different interfacial reactions were observed in each case. The volume changes that occur with the interfacial reactions were calculated based on the identified reaction products. The calculated volume changes correlate with the observed micostructures and appear to be an important factor in determining an optimal buffer layer system. The interfacial reactions do not preclude the attainment of high Ic and Jc values in these coated conductors.

AB - The microstructures of continuously processed YBa2Cu3Oy (YBCO) coated conductors processed with three different architectures are presented. YBCO films were deposited directly on ion-beam-assisted deposition (IBAD) yttria-stabilized zirconia (YSZ) or on intervening layers of Y2O3 or CeO2. Different interfacial reactions were observed in each case. The volume changes that occur with the interfacial reactions were calculated based on the identified reaction products. The calculated volume changes correlate with the observed micostructures and appear to be an important factor in determining an optimal buffer layer system. The interfacial reactions do not preclude the attainment of high Ic and Jc values in these coated conductors.

KW - Coated conductor

KW - IBAD

KW - TEM

KW - YBCO

UR - https://www.scopus.com/pages/publications/0035268489

U2 - 10.1109/77.919783

DO - 10.1109/77.919783

M3 - Conference article

AN - SCOPUS:0035268489

SN - 1051-8223

VL - 11

SP - 3359

EP - 3364

JO - IEEE Transactions on Applied Superconductivity

JF - IEEE Transactions on Applied Superconductivity

IS - 1 III

T2 - 2000 Applied Superconductivity Conference

Y2 - 17 September 2000 through 22 September 2000

ER -

A comparison of buffer layer architectures on continuously processed YBCO coated conductors based on the IBAD YSZ process

Abstract

Keywords

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