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A 10-b 1-GHz 33-mW CMOS ADC

  • University of California at Los Angeles

Research output: Contribution to journalArticlepeer-review

53 Scopus citations

Abstract

This paper describes a pipelined analog-to-digital converter that resolves 4 b in its first stage and amplifies the residue by a factor of 2, thereby relaxing the opamp linearity, voltage swing, and gain requirements. Calibration in the digital domain removes the effect of capacitor mismatches and corrects for the gain error. Using a one-stage opamp with a gain of 10 and realized in 65-nm CMOS technology, the ADC digitizes a 490-MHz input with a signal-to-(noise+distortion) ratio of 52.4 dB, achieving a figure of merit of 97 fJ/conversion-step.

Original languageEnglish
Article number6493461
Pages (from-to)1442-1452
Number of pages11
JournalIEEE Journal of Solid-State Circuits
Volume48
Issue number6
DOIs
StatePublished - 2013

Keywords

  • Analog-to-digital converter (ADC)
  • gain error calibration
  • low power
  • low-gain opamp
  • multibit capacitor mismatch calibration
  • pipelined ADC

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