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Reliability and Lifetime Characterization of Amorphous and Poly-SI: TFT for LCD Application
Wie, Chu Ryang
(PI)
University At Buffalo
Project
:
Research
Overview
Project Details
Status
Finished
Effective start/end date
02/1/08
→
01/31/10
Funding
Samsung Electronics Co LTD:
$125,638.21
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